Q1：What's the imaging principle and hardware support for line-array 900–1700nm band photovoltaic/silicon wafer inspection?

Principle of Silicon Wafer Inspection Imaging: Silicon material is transmissive in the short-wave infrared above 900nm, while visible light can only detect surface scratches. Using a line scan push mode with a conveyor moving at a constant speed, infrared reflection signals of the entire silicon wafer or battery are collected line by line to capture subsurface defects like hidden cracks, voids, and impurities. Different silicon media have stable differences in infrared reflection grayscale, allowing automated batch defect detection. This camera has a 2048-pixel single-line array with 12.5μm pixels, peak quantum efficiency of 70% at 1550nm, and excellent infrared sensitivity. With a full-frame ultra-high line frequency of 79kHz, it suits high-speed photovoltaic production lines for continuous line scanning. It features -20°C PID constant temperature TEC cooling to suppress dark current during long scans, keeping the line’s grayscale stable over time. The global shutter with 1μs ultra-short exposure prevents motion blur in fast-moving wafers. It has 512MB large onboard memory to ensure no frame loss at 79kHz continuous data stream, and CameraLink Full high-speed transmission, synchronized with a photoelectric-coupled IO conveyor encoder, ensures precise line-by-line data acquisition.

Q2：Compared to the same series of area array cameras, what are the different use scenarios for the line scan SWIR2KBCL-80K?

Linear arrays are specifically designed for continuous strips, rolls, and long production line sweeping, with 79kHz high-speed line-by-line scanning, making them suitable for 24/7 uninterrupted online inspection of sheets and films. Area array cameras are better for static samples and single workpiece snapshots and can’t handle continuous imaging on infinitely long conveyor belts, so the two setups are totally incompatible on production lines.

Q3：How does the M42 mount work with original C-mount short-wave lenses, and what shooting scenarios are suitable for each focal length?

M42 mount can be adapted to the full range of C-mount SWIR lenses: 6/8/12mm short focal: wide plastic films, full-tray fruits and vegetables, continuous scanning; 25/35/50mm mid-long focal: narrow silicon wafers, precision films, high-precision scanning for tiny defects; 100mm long focal: long-distance large-area photovoltaic panels, inspection of long strip materials; Full range F1.4~F2.0 large apertures, giving higher signal-to-noise ratio on weak, low-reflection materials.

2K 12.5μm Pixels 900-1700nm SWIR Camera

Overview

Specification

Dimensions & Pin

Triggering(I/O Interface)

Software

Features

FAQ

Feedback

2048-Pixel SWIR Line Scan Camera

The SWIR2KBCL-80K is a high-speed short-wave infrared line scan camera with a 900–1700 nm spectral response and a 79 k frame rate at full 2048 × 1 resolution. Equipped with CameraLink Full interface and an M42 lens mount, it delivers reliable, high-throughput imaging for industrial machine vision, semiconductor inspection, and agricultural sorting applications.

Features

The spectral response range covers 900–1700 nm.

2048×1 resolution，12.5 μm pixel size

Quantum efficiency reaches 70% at 1550 nm

Global shutter, high-speed acquisition

Hardware ROI & external triggering

512MB cache Model-Dependent

CE/FCC Cerifcation，Multi-platform SDK

Software

AttosView supports Windows® 7 (64-bit),10 and 11 operating systems.
The SDK supports development languages such as C/C++, C #/VB.net, Python, Java, etc,
Third-party support including LabVIEW, MATLAB, Micro-Manager, DirectShow, and TWAIN.

Images acquired by the SWIR2KBCL-80K camera

The SWIR2KBCL-80K line scan camera enables real-time scanning and online inspection of continuously moving targets. Ideal for material sorting and industrial line-scan imaging, the camera excels in semiconductor wafer inspection, solar cell panel examination, in-process sorting, and hot glass inspection. With its 900–1700 nm spectral response, the SWIR camera reliably detects material composition, moisture, and thermal anomalies, making it a versatile solution for demanding machine vision environments.

Model	SWIR2048L3A-CL80K
Sensor Type	InGaAs SWIR line-scan image sensor
Spectral Range	900–1700 nm
Resolution	2048 pixels (2048 × 1)
Pixel Size	12.5 µm × 12.5 µm
Sensor Size	25.6 mm
Frame Rate	79K @ 2048×1
Memory	512 MByte
Quantum Efficiency	70% @ 1550 nm
Conversion Gain	6.1 e-/ADU (GAIN = 1)
Dynamic Range	64.1 dB (GAIN = 1)
Readout Noise	60.4 e- (GAIN = 1)
Full Well Capacity	96.4 ke- (GAIN = 1)
Maximum SNR	49.8 dB (GAIN = 1)
Exposure Time Range	1us-1s
Shutter Type	Global Shutter
Data Interface	CameraLink Full
Digital I/O	1 channel of optically isolated input, 1 channel of optically isolated output
Data Format	14 bit
Cooling performance	40°C below ambient temperature
Lens Mount	M42
Dimensions	68 mm × 68 mm × 90.3 mm
Weight	485 g
Software	AttosView/SDK/CLView
Operating Temperature	-40 °C to 70 °C
Storage Temperature	-40 °C to 70 °C
Humidity	20%-80%, non-condensing
Certification	CE, FCC

Quantum Efficiency Curve

Dimensions and Ports of the SWIR2KBCL-80K SWIR camera

SWIR2KBCL-80K Series Camera Pin Signal

Table1: USB port, GigE port, CL port refrigerated camera pin signal definitions
	Color	Pin	Signal	Description of the signal
	White	1	GDN	Direct-coupled signal ground
	Red	2	12V	12VDC power input
	Blue	3	OPTO_GND	Opto-isolated signal ground
	Yellow	4	DIR_GPIO0	Direct-coupled General Purpose I/O (Software configurable input/output) (line2)
	Black	5	DIR_GPIO1	Direct-coupled General Purpose I/O (Software configurable input/output) (line3)
	Green	6	OPTO_IN	Opto-isolated input signal (line0)
	Pink	7	OPTO_OUT	Opto-isolated output signal (line1)

I/O electrical characteristics

Opto-isolated input circuit (line0)

Logic 0 input level: 0~2.2VDC (OPTO_IN pin)
Logic 1 input level: 3.3~24VDC (OPTO_IN pin)
Maximum input current:30mA

When the input level is between 2.2V and 3.2V, the circuit operation state is uncertain, please do not let SWIR camera work within this voltage range.

Input rise delay (TDR): 6us

Input fall delay (TDF): 6us

Figure 1：Input logic levels

Opto-isolated output circuit (line1)

The opto-isolated output maximum current is 30mA.

Figure 2: Output logic levels

The electrical characteristics of the opto-isolated output (external voltage 5V, external resistor 1K) are shown in Table 2.

Table 2： Opto-isolated output signal’s electrical characteristics
Parameter name	Parameter notation	Parameter value
Output logic low	VL	742mV
Output logic high	VH	4.134V
Output rise time	TR	4us
Output fall time	TF	1.8us
Output rise delay	TDR	12us
Output fall delay	TDF	2us

The output of the corresponding output current and VL when using different voltages and resistors in externalcircuit are shown in Table 3.

Table 3：Opto-isolated output logic’s low levels parameters
External voltage	External resistor	VL	Output current
3.3V	1KΩ	510mV	2.82mA
5V	1KΩ	742mV	4.31mA
12V	2.4KΩ	795mV	4.68mA
24V	4.7KΩ	850mV	4.97mA

Input and output I/O circuit (line2/line3)

1. Line2/line3 is set as input pin
Logic 0 input level: 0~0.6VDC (DIR_GPIO0/DIR_GPIO1 pins)
Logic 1 input level: 2.0~24VDC (DIR_GPIO0/DIR_GPIO1 pins)
Maximum input current: 25mA
When the input level is between 0.6V and 2.0V, the circuit action state is uncertain, please avoid the input voltage range working in this range.

To prevent damage to the GPIO pins, please connect the pin GND first, and then input voltage to the Line2 pin.
Input rise delay (TDR): 0.02us
Input fall delay (TDF): 0.02us

2. Line2/line3 are set as output pins
The maximum current allowed through this pin is 25mA.
The external pull-up voltage is 5V, the pull-up resistor is 1KΩ, and the GPIO is configured to output the logic level and electrical characteristics as shown in Figure 4.

Figure 3: Input logic levels

Figure 4: Output logic levels

When the ambient temperature is 25 degrees Celsius, the relationship between the external voltage, resistance and low-level voltage output is shown in Table 4.

Table 4：Non-isolated output Logic’s low level parameters
External voltage	External resistor	VL(GPIO)
3.3V	1KΩ	0.11V
5V	1KΩ	0.167V
12V	2.4KΩ	0.184V
24V	4.7KΩ	0.385V

Table 5: Non-isolated output electrical characteristics
Parameter name	Parameter notation	Parameter value
Output rise time	TR	0.08us
output fall time	TF	0.02us
Output rise delay	TDR	0.1us
Output fall delay	TDF	0.04u

AttosView

AttosView support all Attostek UV-VIS and SWIR cameras, it is a professional software that integrates camera control, image acquisition and processing, image browsing and analysis functions.

AttosView has the following characteristics:

x86: XP SP3 and above; CPU support SSE2 and above
x64: Win7 and above

Introduction to SDK

ascamsdk support a variety of APIs, including: Native C/C++,.NET/C#/VB.NET, Python, Java, DirectShow, Twain, LabView, Matlab, etc. Compared with other APIs, Native C/C++ API as a low-level API is characterized by using pure C/C++ development without relying on other runtime libraries. The interface is simple and the control is flexible.

Supported SDK platforms include: Win32 and WinRT, macOS, Linux, Android.

The supported versions for Win32 are as follows:

x86: XP SP3 and above; the CPU needs to support at least the SSE2 instruction set.
x64: Win7 and above.
arm: Win10 and above.
arm64: Win10 and above.

Third-party interface software

AttosTek provides extensive third-party software support for its UV-Vis cameras and SWIR cameras, facilitating rapid integration and use in various development environments. This includes SDK and demo programs for LabVIEW and MATLAB, as well as DirectShow drivers, Micromanager, and TWAIN SDK drivers. These features enable seamless compatibility with mainstream development environments and third-party software, greatly simplifying the workflow for system integration and secondary development.

AttosView

Support all Attostek UV-VIS and SWIR cameras.

Click the button below to download the AttosView software.

Download

SDK

Support a variety of APIs.

Click the button below to download the SDK.

Download

Third-Party Software

DirectShow Driver:

Download

Micromanager Driver:

Download

TWAIN SDK Driver:

Download

Frame Grabber Driver

For the SWIR2KBCL-80K SWIR camera (CameraLink interface), the recommended frame grabber is:

Magewell：

Download

FIREBIRD：

Download

Hikvision：

Download

Recommended PC Configuration

AttosView Recommended System Requirements
Operating System	Microsoft® Windows® XP / Vista / 7 / 8 /10 /11(32 & 64 bit), Mac OSX, Linux
Processor (CPU)	≥3.0 GHz Intel Core i5 or Higher
Memory (RAM)	≥8 GB
Hard Drive	NVMe Solid State Drive (SSD)
Graphics Card	Dedicated Adapter with ≥256 MB RAM
Motherboard	USB 3.0 (-USB) Cameras: Integrated Intel USB 3.0 Controller or One Unused One Unused PCle3.0*16 Slot
Connectivity	Internet Connectivity for Driver Installation

User interface design

The image below shows the interface of the Attosview software. For more detailed information, please download the product manual.

Function	Function description
Operating mode	Operating mode: video mode or trigger mode Trigger mode: soft trigger mode or external trigger mode
Denoise	The camera hardware incorporates denoise
Automatic exposure	Automatic exposure or manual exposure function
Gain	HG, MG, LG 3 gain modes
Frame rate	Supports precise frame rate control
ROI	Supports single-zone ROI with a maximum frame rate of 8000fps after ROI
Flip	Supports Vertical/horizontal flip
Custom dark field correction	The hardware supports up to 12 groups of user-defined dark field correction image functions
Timestamp function	Timestamps can be turned on or off. After the timestamp function is enabled, the low 8bits of 1-8 pixels, 9-16 pixels, and 17-24 pixels will be modified to: 0-7: frame number; 8-15: Frame time; 16-23: trigger signal count
Firmware update	Supports firmware online update
Pipette function	Supports the display of the gray value of the mouse pixel position
Histogram display	Supports histogram display and statistics
Plane line function	Supports the function of viewing surface data
Regional gray statistics	Support the average gray statistics function of user-defined areas
Cooling system	1) The cooling system of the camera uses a built-in TEC cooling chip for the sensor, with external heat dissipation structure and fan auxiliary heat dissipation, the working temperature can be adjusted to a specific value, the effective cooling temperature can be lower than the ambient temperature of 40℃, and the high-efficiency cooling system ensures extremely low dark current level; 2) The TEC system adopts PID algorithm control, so that TEC can accurately adjust the sensor to the target temperature, and the temperature deviation is 0.3℃;

Q1：What's the imaging principle and hardware support for line-array 900–1700nm band photovoltaic/silicon wafer inspection?
Principle of Silicon Wafer Inspection Imaging: Silicon material is transmissive in the short-wave infrared above 900nm, while visible light can only detect surface scratches. Using a line scan push mode with a conveyor moving at a constant speed, infrared reflection signals of the entire silicon wafer or battery are collected line by line to capture subsurface defects like hidden cracks, voids, and impurities. Different silicon media have stable differences in infrared reflection grayscale, allowing automated batch defect detection.

This camera has a 2048-pixel single-line array with 12.5μm pixels, peak quantum efficiency of 70% at 1550nm, and excellent infrared sensitivity. With a full-frame ultra-high line frequency of 79kHz, it suits high-speed photovoltaic production lines for continuous line scanning. It features -20°C PID constant temperature TEC cooling to suppress dark current during long scans, keeping the line’s grayscale stable over time. The global shutter with 1μs ultra-short exposure prevents motion blur in fast-moving wafers. It has 512MB large onboard memory to ensure no frame loss at 79kHz continuous data stream, and CameraLink Full high-speed transmission, synchronized with a photoelectric-coupled IO conveyor encoder, ensures precise line-by-line data acquisition.
Q2：Compared to the same series of area array cameras, what are the different use scenarios for the line scan SWIR2KBCL-80K?
Linear arrays are specifically designed for continuous strips, rolls, and long production line sweeping, with 79kHz high-speed line-by-line scanning, making them suitable for 24/7 uninterrupted online inspection of sheets and films.

Area array cameras are better for static samples and single workpiece snapshots and can’t handle continuous imaging on infinitely long conveyor belts, so the two setups are totally incompatible on production lines.
Q3：How does the M42 mount work with original C-mount short-wave lenses, and what shooting scenarios are suitable for each focal length?
M42 mount can be adapted to the full range of C-mount SWIR lenses:

6/8/12mm short focal: wide plastic films, full-tray fruits and vegetables, continuous scanning;

25/35/50mm mid-long focal: narrow silicon wafers, precision films, high-precision scanning for tiny defects;

100mm long focal: long-distance large-area photovoltaic panels, inspection of long strip materials;

Full range F1.4~F2.0 large apertures, giving higher signal-to-noise ratio on weak, low-reflection materials.

2048 Line Scan Cameras for imaging & machine vision

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Docs

Available

Price

Qty

SWIR2KBCL-80K

2048 Line Scan SWIR Cameras, 12.5μm Pixels, CameraLink Interface

2 Weeks

Optional accessories – lenses

To meet the diverse application demands of short-wave infrared (SWIR) imaging, Attostek offer a series of high-performance SWIR lenses. This lineup covers focal lengths from 6mm to 100mm and features a wide aperture range of F1.4 to F2.0 as standard, ensuring high signal-to-noise ratio and superior image quality even in low-light conditions. Users can flexibly select different models based on field of view, working distance, and resolution requirements, providing high sensitivity and versatile scene adaptability for SWIR cameras in applications such as security surveillance, industrial inspection, and scientific research.

Item

Docs

2K 12.5μm Pixels 900-1700nm SWIR Camera

Q1：What's the imaging principle and hardware support for line-array 900–1700nm band photovoltaic/silicon wafer inspection?

Q2：Compared to the same series of area array cameras, what are the different use scenarios for the line scan SWIR2KBCL-80K?

Q3：How does the M42 mount work with original C-mount short-wave lenses, and what shooting scenarios are suitable for each focal length?

2048 Line Scan Cameras for imaging & machine vision

Optional accessories – lenses

Practical Cases

Related Camera